Bidimensional lifetime control for high-speed low-loss PiN rectifiers

Ettore Napoli

abstract

In the paper a recently proposed lifetime control technique able to control device carrier lifetime not only in the axial direction, but also in the longitudinal direction (2D lifetime control), is analyzed.
Static and dynamic losses of PiN diode using 2D lifetime control are studied through mixed mode circuit-device simulations. It is shown that 2D lifetime control gives a better trade-off between static and dynamic behavior with respect to electron irradiation technique.
The comparison with axial lifetime control shows that, notwithstanding similar performances are achieved using the two techniques, 2D lifetime control provides greater design flexibility.